The 4 in 1 Mega-Idea Motherboard Layered Test Fixture is designed for testing the motherboards of iPhone 17 series devices. It addresses common issues encountered during motherboard testing, ensuring accurate data collection and stability.
- Product Type: Repair Fixture
- Compatibility: iPhone 17, iPhone 17 Air, iPhone 17 Pro, iPhone 17 Pro Max
- Material: BeCu spring probes
- Key Feature: Layered test design
- Intended Use: Motherboard testing
- Manufacturing Process: CNC high-precision machining
- Probe Type: Double-headed probe for accurate alignment
- Stability Features: Fixed buckles to prevent motherboard warping
- Conductivity: Good conductivity with stable overload and low deviation in detected values
- Probe Characteristics: Tapered probe resistant to rosin and solder contamination
- Spring Mechanism: Spring buckle for quick rebound
- Foot Pads: Anti-slip, wear-resistant foot pads for stability
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